Table T4. Composition of samples used for calibration of shipboard XRF analyses.
Sample
Element oxides
(wt%)
Trace elements
(ppm)
TiO2
FeO
Zr
Cr
Ni
Sr
83820 0.87 10.24 43 691 346 77
83837 4.07 15.08 281 43 69 221
83888 2.34 12.64 162 178 88 235
83889 1.12 11.6 61 166 84 101
83883 5.13 15.45 346 106 78 303
412481 2.98 15.24 174 74 66 195
412493 1.24 11.72 64 158 94 124
437171 2.38 12.87 137 100 84 241
83834 0.68 9.59 34 976 628 55
83839 0.89 9.98 44 486 203 102
83877 4.75 14.54 320 178 93 284
83893 1.58 13.8 83 72 63 89
412422 3.46 15.28 248 84 61 241
404208 1.82 11.15 125 504 252 218
404210 1.78 8.82 133 505 122 244
404211 0.9 12.32 67 926 1061 13
404214 1.18 12.42 85 1533 920 112
404217 1.02 11.97 71 1663 913 38
404262 0.99 9.72 46 383 158 74
404175 2.43 11.23 175 234 101 291

Note: TiO2 and FeO (total Fe) are conventional X-ray fluorescence (XRF) analyses (GEUS XRF laboratory, Copenhagen, Denmark). Zr, Cr, Ni and Sr are ICP-MS analyses (Oregon State University, USA), except for Zr concentrations in samples 83837, 83883, and 83877, which are XRF analyses from the GEUS laboratory.