Figure 5. Cyclic variations in Formation MicroScanner (FMS) image resistivity, log resistivity (SFLU), porosity (APLC), photoelectric factor (PEF), uranium (HURA), and borehole diameter. Picked cycles are indicated by horizontal lines. Note also the occurrence of uncemented clay layers at 585.5, 599, and 608 mbsf.

Figure 5. Cyclic variations in Formation MicroScanner (FMS) image resistivity, log resistivity (SFLU), porosity (APLC), photoelectric factor (PEF), uranium (HURA), and borehole diameter. Picked cycles are indicated by horizontal lines. Note also the occurrence of uncemented clay layers at 585.5, 599, and 608 mbsf.