Figure F46. Correlation between the Formation MicroScanner (FMS) image, summary of visually defined lithologic intervals, deformation categories, and extents obtained from microstructural analyses of 147 thin sections from different depth intervals. Also shown are the distribution of shear zones obtained through FMS interpretation and distribution of crystal-plastic foliation fabric in Hole 1105A. FMS image varies between conductive zones (dark) and resistive zones (light). Conductive zones are typically oxide rich. Highest extents of deformation generally, but not always, correlate with conductive zones. Visually defined lithologic intervals and distribution of crystal-plastic foliation fabric are taken from and Shipboard Scientific Party (1999c).

Figure F46. Correlation between the Formation MicroScanner (FMS) image, summary of visually defined lithologic intervals, deformation categories, and extents obtained from microstructural analyses of 147 thin sections from different depth intervals. Also shown are the distribution of shear zones obtained through FMS interpretation and distribution of crystal-plastic foliation fabric in Hole 1105A. FMS image varies between conductive zones (dark) and resistive zones (light). Conductive zones are typically oxide rich. Highest extents of deformation generally, but not always, correlate with conductive zones. Visually defined lithologic intervals and distribution of crystal-plastic foliation fabric are taken from and Shipboard Scientific Party (1999c).