Table T7. Principal channels of the logging tools.
| Tool | Parameter | Meaning | Units |
|---|---|---|---|
| HNGS | Hostile environment spectral gamma ray sonde | ||
| HSGR | Standard (total) gamma ray | gAPI | |
| HCGR | Corrected gamma ray (HSGR - uranium contribution) | gAPI | |
| HFK | Formation potassium | Fraction | |
| HTHO | Thorium | ppm | |
| HURA | Uranium | ppm | |
| NGT-C | Natural gamma ray tool | ||
| SGR | Standard total gamma ray | gAPI | |
| CGR | Computed gamma ray (SGR minus uranium contribution) | gAPI | |
| POTA | Potassium | Fraction | |
| THOR | Thorium | ppm | |
| URAN | Uranium | ppm | |
| APS | Accelerator porosity sonde | ||
| APLC | Near array porosity (limestone corrected) | Fraction | |
| FPLC | Far array porosity (limestone corrected) | Fraction | |
| SIGF | Neutron capture cross section of the formation (Sf) | cu | |
| STOF | Tool standoff (computed distance from borehole wall) | in | |
| HLDS | High temperature lithodensity sonde | ||
| RHOB | Bulk density (corrected) | g/cm3 | |
| PEF | Photoelectric effect factor | barns/e- | |
| DRHO | Bulk density correction | g/cm3 | |
| LCAL | Caliper measure of borehole diameter | in | |
| DIT-E/SFR | Phasor dual induction-spherically focused resistivity tool | ||
| IDPH | Deep induction phasor-processed resistivity | ||
| IMPH | Medium induction phasor-processed resistivity | ||
| SFLU | Spherically focused log of resistivity | ||
| DLL | Dual laterolog | ||
| LLd | Deep resistivity | ||
| LLs | Shallow resistivity | ||
| TAP | High-resolution temperature/acceleration/pressure tool | ||
| T, A, P | Temperature/acceleration/pressure | °C, mm/s2, psi | |
| LSS | Long spacing sonic sonde | ||
| LTT1-4 | Transit time (10', 8', 12', 10' respectively) | ms | |
| DTLN, DTLF | Transit time differential (10'-8', 12'-10') | ms/ft | |
| WF1-4 | Sonic waveforms | ||
| ITT | Integrated transit time | s | |
| GPIT | General purpose inclinometer tool | ||
| Fx, Fy, Fz | Magnetic field on x, y, z axis | oer | |
| FNOR | Intensity of the total magnetic field | oer | |
| HAZI | Hole azimuth | ° | |
| DEVI | Deviation | ° | |
| FMS | Formation MicroScanner resistivity image | ||
| CNT-G | Compensated neutron log | ||
| NPHI | Thermal porosity | Fraction | |
| AACT | Aluminum activation clay tool | ||
| UWAL | Uncorrected Al wet% | Fraction | |
| ALUM | Corrected Al wet wt% | Fraction | |
| GST | Induced-gamma spectrometry tool | ||
| CSIG | Capture cross section | cu | |
| CTB | Background yield | Fraction | |
| PHIG | GST porosity | Fraction | |
| Yield of Si, Ca, Fe, S, H, Cl | Fraction |
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