Table T3. X-ray fluorescence operating conditions during XRF analyses.
| Oxide
or element |
Background offset (°2 |
Count time | ||||||
|---|---|---|---|---|---|---|---|---|
| Line | Crystal | Detector | Collimator | Peak
angle (°2 |
Peak (s) |
Background (s) |
||
| Major element (wt%) | ||||||||
| SiO2 | Ka | PET | FPC | Medium | 109.21 | 40 | ||
| TiO2 | Ka | LIF200 | FPC | Fine | 86.14 | 40 | ||
| Al2O3 | Ka | PET | FPC | Medium | 145.12 | 100 | ||
| Fe2O3 | Ka | LIF200 | FPC | Fine | 57.52 | 40 | ||
| MnO | Ka | LIF200 | FPC | Fine | 62.97 | 100 | ||
| MgO | Ka | TLAP | FPC | Medium | 45.17 | ±0.80 | 150 | 150 |
| CaO | Ka | LIF200 | FPC | Medium | 113.09 | 40 | ||
| Na2O | Ka | TLAP | FPC | Medium | 54.10 | -1.20 | 150 | 150 |
| K2O | Ka | LIF200 | FPC | Medium | 136.69 | 100 | ||
| P2O5 | Ka | GE111 | FPC | Medium | 141.04 | 100 | ||
| Trace element (ppm) | ||||||||
| Rh | LIF200 | Scint | 18.58 | 60 | ||||
| Nb | Ka | LIF200 | Scint | Fine | 21.40 | +0.35 | 200 | 100 |
| Zr | Ka | LIF200 | Scint | Fine | 22.55 | -0.35 | 100 | 50 |
| Y | Ka | LIF200 | Scint | Fine | 23.80 | -0.40 | 100 | 50 |
| Sr | Ka | LIF200 | Scint | Fine | 25.15 | -0.40 | 100 | 50 |
| Rb | Ka | LIF200 | Scint | Fine | 26.62 | -0.60 | 100 | 50 |
| Zn | Ka | LIF200 | Scint | Medium | 41.81 | -0.55 | 100 | 50 |
| Cu | Ka | LIF200 | Scint | Fine | 45.03 | -0.55 | 100 | 50 |
| Ni | Ka | LIF200 | Scint | Medium | 48.67 | -0.60 | 100 | 50 |
| Cr | Ka | LIF200 | FPC | Fine | 69.35 | -0.50 | 100 | 50 |
| V | Ka | LIF220 | FPC | Fine | 123.06 | -0.50 | 100 | 50 |
Notes: All major elements measured using a rhodium X-ray tube operated at 30 kV and 80 mA. Trace elements are measured using a rhodium X-ray tube operated at 60 kV and 50 mA. FPC = flow-proportional counter (P10 gas); Scint = NaI Scintillation counter. This table is also available in ASCII format.
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