Table T3. X-ray fluorescence operating conditions during XRF analyses.
Oxide
or element |
Background offset (°2) |
Count time | ||||||
---|---|---|---|---|---|---|---|---|
Line | Crystal | Detector | Collimator | Peak
angle (°2) |
Peak (s) |
Background (s) |
||
Major element (wt%) | ||||||||
SiO2 | Ka | PET | FPC | Medium | 109.21 | 40 | ||
TiO2 | Ka | LIF200 | FPC | Fine | 86.14 | 40 | ||
Al2O3 | Ka | PET | FPC | Medium | 145.12 | 100 | ||
Fe2O3 | Ka | LIF200 | FPC | Fine | 57.52 | 40 | ||
MnO | Ka | LIF200 | FPC | Fine | 62.97 | 100 | ||
MgO | Ka | TLAP | FPC | Medium | 45.17 | ±0.80 | 150 | 150 |
CaO | Ka | LIF200 | FPC | Medium | 113.09 | 40 | ||
Na2O | Ka | TLAP | FPC | Medium | 54.10 | -1.20 | 150 | 150 |
K2O | Ka | LIF200 | FPC | Medium | 136.69 | 100 | ||
P2O5 | Ka | GE111 | FPC | Medium | 141.04 | 100 | ||
Trace element (ppm) | ||||||||
Rh | Compton | LIF200 | Scint | 18.58 | 60 | |||
Nb | Ka | LIF200 | Scint | Fine | 21.40 | +0.35 | 200 | 100 |
Zr | Ka | LIF200 | Scint | Fine | 22.55 | -0.35 | 100 | 50 |
Y | Ka | LIF200 | Scint | Fine | 23.80 | -0.40 | 100 | 50 |
Sr | Ka | LIF200 | Scint | Fine | 25.15 | -0.40 | 100 | 50 |
Rb | Ka | LIF200 | Scint | Fine | 26.62 | -0.60 | 100 | 50 |
Zn | Ka | LIF200 | Scint | Medium | 41.81 | -0.55 | 100 | 50 |
Cu | Ka | LIF200 | Scint | Fine | 45.03 | -0.55 | 100 | 50 |
Ni | Ka | LIF200 | Scint | Medium | 48.67 | -0.60 | 100 | 50 |
Cr | Ka | LIF200 | FPC | Fine | 69.35 | -0.50 | 100 | 50 |
V | Ka | LIF220 | FPC | Fine | 123.06 | -0.50 | 100 | 50 |
Notes: All major elements measured using a rhodium X-ray tube operated at 30 kV and 80 mA. Trace elements are measured using a rhodium X-ray tube operated at 60 kV and 50 mA. FPC = flow-proportional counter (P10 gas); Scint = NaI Scintillation counter. This table is also available in ASCII format.