Figure F18. Resistivity-at-the-bit image of the base of the décollement zone. Minimal deformation is observed in the form of several discrete fractured intervals, containing high-angle conductive fractures (dark sinusoidal features at 959 and 965 mbsf).

Figure F18. Resistivity-at-the-bit image of the base of the décollement zone. Minimal deformation is observed in the form of several discrete fractured intervals, containing high-angle conductive fractures (dark sinusoidal features at 959 and 965 mbsf).