|
Element
|
Instrument detection
limit (ppb) |
Wavelength (nm)
|
Slit width (nm)*
|
Integration
time per calculation point (s) |
Voltage (V)
|
Mode
|
Increment between
points (nm)† |
Calculation (pts)
|
|---|---|---|---|---|---|---|---|---|
| Al | 2.8 | 396.152 | 20/15 | 0.5 | 690 | 2 | 0.0020 | 5 |
| Ca | 0.2 | 393.366 | 20/15 | 0.5 | 330 | 2 | 0.0020 | 5 |
| Fe | 6.2 | 259.940 | 20/15 | 0.5 | 660 | 5 | 0.0020 | 5 |
| K | 60 | 766.490 | 20/15 Alk | 0.5 | 990 | 2 | 0.0020 | 5 |
| Mg | 1.6 | 285.213 | 20/15 | 0.5 | 730 | 5 | 0.0020 | 5 |
| Mn | 1.4 | 257.610 | 20/15 | 0.5 | 670 | 5 | 0.0020 | 5 |
| Na | 69 | 589.592 | 20/15 Alk | 0.5 | 590 | 2 | 0.0020 | 5 |
| P | 272 | 178.229 | 20/15 | 0.5 | 990 | 2 | 0.0020 | 5 |
| Si | 12 | 251.611 | 20/15 | 0.5 | 680 | 2 | 0.0020 | 5 |
| Ti | 3.8 | 334.941 | 20/15 | 0.5 | 730 | 2 | 0.0020 | 5 |
| Ba | 1.3 | 455.403 | 20/15 | 0.5 | 600 | 5 | 0.0020 | 5 |
| Cr | 7 | 267.716 | 20/15 | 0.5 | 680 | 5 | 0.0020 | 5 |
| Cu | 5.4 | 324.754 | 20/15 | 0.5 | 670 | 2 | 0.0020 | 5 |
| Ni | 15 | 231.604 | 20/15 | 0.5 | 780 | 2 | 0.0020 | 5 |
| Sc | 1.5 | 361.384 | 20/15 | 0.5 | 550 | 5 | 0.0020 | 5 |
| Sr | 0.4 | 407.771 | 20/15 | 0.5 | 780 | 2 | 0.0020 | 5 |
| V | 7.5 | 292.402 | 20/15 | 0.5 | 780 | 5 | 0.0020 | 5 |
| Y | 3.5 | 371.029 | 20/15 | 0.5 | 550 | 5 | 0.0020 | 5 |
| Zn | 1.8 | 213.856 | 20/15 | 0.5 | 810 | 2 | 0.0020 | 5 |
| Zr | 71 | 343.823 | 20/15 | 0.5 | 560 | 2 | 0.0020 | 5 |
Notes: BAS192 method acquisition parameters. * = widths of the entrance and exit slits; Alk = increase in sheath gas flow from 0.15-0.2 L/min to 0.8 L/min for analysis of these elements. † = interval between each of the calculation points in Mode 2, or the calculation window that constitutes the single point in Mode 5.