Table AT1. Precision and accuracy of analyzed elements.
Element
Method
Precision SD
(1) (rel%)
Accuracy
(rel%)
TS IR analyzer 2.7 102.6
TC IR analyzer 1.3 100.5
TIC Coulometry 0.8 99.8
SiO2 XRF 0.4 99.7
TiO2 XRF 1.0 102.8
Al2O3 XRF 0.5 99.9
Fe2O3 XRF 0.4 100.6
MnO XRF 1.4 101.5
MgO XRF 0.6 108.7
CaO XRF 0.5 100.4
Na2O XRF 0.0 98.9
K2O XRF 1.4 92.7
P2O5 XRF 0.7 103.4
As XRF 2.7 93.8
Ba XRF 3.0 104.7
Co XRF 5.4 98.1
Cr XRF 3.6 108.8
Cu XRF 3.7 89.8
Mo XRF 4.7 101.6
Ni XRF 0.8 99.0
Pb XRF 9.0 93.6
Rb XRF 2.0 98.2
Sr XRF 0.5 102.5
U XRF 8.8 105.5
V XRF 1.2 104.3
Y XRF 3.0 100.7
Zn XRF 1.7 97.8
Zr XRF 2.8 103.0
REE ICP-MS 6.8* 95.9–102.6

Notes: Accuracy is defined as 100% times the mean of the repeat analyses divided by the expected value. Precision is defined as 100% times the best estimate standard deviation (1) divided by the mean of the repeats. SD = standard deviation. REE = rare earth element. IR = infrared, XRF = X-ray fluorescence, ICP-MS = inductively coupled–plasma mass spectrometry. * = maximum value. † = range.