Figure F43. Formation MicroScanner (FMS) images and chert layers between 280 and 320 mbsf showing (A) hole shape, (B) static and (D) dynamic (window height = 0.5 m) normalization of the microresistivity images, (C) conductive (chert) layers, (E) total spectral gamma radiation (HSGR from HNGS and gamma radiation [GR] from the MGT) and (F) shallow resistivity (SFLU) logs, and (G) extracted FMS button records showing the poor pad–formation contact (red). Yellow rectangles = zone where stick-slip displacements occurred and impaired image quality (circled area).

Figure F43. Formation MicroScanner (FMS) images and chert layers between 280 and 320 mbsf showing (A) hole shape, (B) static and (D) dynamic (window height = 0.5 m) normalization of the microresistivity images, (C) conductive (chert) layers, (E) total spectral gamma radiation (HSGR from HNGS and gamma radiation [GR] from the MGT) and (F) shallow resistivity (SFLU) logs, and (G) extracted FMS button records showing the poor pad–formation contact (red). Yellow rectangles = zone where stick-slip displacements occurred and impaired image quality (circled area).