Table T6. Analytical conditions for ICP-AES analyses.
Element
Wavelength
(nm)
Integration time/calculation point
(s)
Photomultiplier
voltage
Photomultiplier
gain
Increment between points
(nm)
Calculation
points
(N)
Limit of detection
(ppm)
Al* 396.152 1.0 720 1 0.0027 5 0.03
Ba 455.403 1.0 730 10 0.0027 5 39
Ca* 393.366 1.0 350 1 0.0027 5 0.06
Co 228.616 1.0 990 100 0.0027 5 32
Cr 267.716 1.0 860 100 0.0027 5 41
Cu 324.754 1.0 690 10 0.0027 5 2
Fe* 259.940 1.0 560 10 0.0027 5 0.13
K* 766.490 1.0 990 100 0.0027 5 0.01
Mg* 285.213 1.0 600 10 0.0027 5 0.41
Mn* 257.610 1.0 580 100 0.0027 5 0.001
Na* 589.592 1.0 610 10 0.0027 5 0.03
Ni 231.604 1.0 990 100 0.0027 5 165
P 178.229 1.0 933
0.0027 5 0.06
Si* 251.611 1.0 570 10 0.0027 5 0.22
Sr 407.771 1.0 560 10 0.0027 5 5
V 292.402 1.0 960 100 0.0027 5 5
Y 371.029 1.0 620 100 0.0027 5 2
Zr 343.823 1.0 640 100 0.0027 5 2
Ti* 334.941 1.0 570 10 0.0027 5 0.01
Sc 361.384 1.0 660 100 0.0027 5 0.4

Notes: ICP-AES = inductively coupled plasma–atomic emission spectrometry. N = number. * = limit of detection reported as oxide (wt%). † = from Shipboard Scientific Party, 2002 (Leg 197). Instrument detection limits represent 3 times the instrument blank. This table is also available in ASCII.